Topsil has designed a unique uniform float zone based high purity
silicon substrate (UHPS) with tight resistivity tolerance
performing up to unprecedented level. The substrate targets high
resolution x-ray, particle and optical detectors.
The silicon wafers allow for higher energy resolution and shorter shaping times of detectors used in e.g. space science, crystallography and the medical industry. The UHPS wafers are characterised by:
- Crystal perfectness
- Optimised resistivity variation
- Precise doping uniformity
- Precise resistivity control
Topsil UHPS silicon substrate has very homogeneous distribution and is available as 100 and 150 mm wafers.
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